Tensile Straightening of Superfine Wire and Residual Stress Measurement Using Focused Ion Beam

Micro-scale residual stress relaxation measurements using focused ion beam slotting and digital image correlation

The research presented in this summary was carried out by the author as part of his fourth-year group industrial project [1], in pursuit of the degree Master of Engineering in Mechanical Engineering at the University of Bristol. The project, Measurement of residual stress in heterogeneous materials, was conducted with three other students and consisted of experimental work at the microand macro...

Sculpting on polymers using focused ion beam

Available online 13 June 2008 It has been recently shown t

Microscale Metallography Using Focused Ion Beam

Microstructural examination can provide a rich tapestry of information about the processing and application history of a metal component. For this reason, microstructural characterization is a fundamental tool for failure analysis of these components. To reduce costs and accommodate demands for smaller packaging, many applications currently use metallic components where the critical dimensions ...

Focused Ion Beam Lithography

Extraction and Analysis of Microcrater Residues Using Focused Ion Beam

Introduction: Microcraters within Stardust aluminium foils have the potential to trap impact residues – probably molten or partially vapourised – of comet Wild 2 material [1]. Thus, in addition to the cometary particles captured by aerogel, microcraters may also reveal compositional information. In anticipation of this we have prepared a technique using focused ion beam microscopy to extract an...